• High-Resolution Digital Microscope for Semiconductor Wafer
  • High-Resolution Digital Microscope for Semiconductor Wafer
  • High-Resolution Digital Microscope for Semiconductor Wafer
  • High-Resolution Digital Microscope for Semiconductor Wafer
  • High-Resolution Digital Microscope for Semiconductor Wafer
  • High-Resolution Digital Microscope for Semiconductor Wafer

High-Resolution Digital Microscope for Semiconductor Wafer

After-sales Service: 1 Year
Warranty: 1 Year
Magnification: >1000X
Type: Video
Number of Cylinder: Binoculars
Mobility: Desktop
Samples:
US$ 125000/Piece 1 Piece(Min.Order)
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Customization:
Gold Member Since 2016

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  • Overview
  • Product Description
  • Product Parameters
  • Detailed Photos
Overview

Basic Info.

Model NO.
LS AFM
Stereoscopic Effect
Stereoscopic Effect
Kind of Light Source
Ordinary Light
Shape
Single-lens
Usage
Teaching
Principle
Optics
Principle of Optics
Polarizing Microscope
Sample Size
Φ≤90mm,H≤20mm
Max. Scan Range
X/Y: 20 Um, Z: 2 Um
Resolution
X/Y:160;0.2 Nm, Z: 0.05nm
Scan Rate
0.6Hz~4.34Hz
Feedback Type
DSP Digital Feedback
PC Connection
USB2.0
Windows
Compatible with Windows98/2000/XP/7/8
Scan Angle
Random
Sample Movement
0~20mm
Data Points
256×256,512×512
Transport Package
Carton and Wooden
Specification
55 lbs
Trademark
flyingman
Origin
China
HS Code
9011800090
Production Capacity
100pieces/Month

Product Description

 

Suzhou FlyingMan Precision Instruments Co., Ltd. presents the High-Resolution Digital Microscope for Semiconductor Wafer, ideal for advanced analysis and quality control in the semiconductor industry.

Product Description






Atomic Force Microscope Features



 

Features



 

The first large-scale industrial atomic force microscope in China to achieve commercial production

 

  • Sample size and weight almost unlimited, ideal for testing large samples like wafers, ultra large gratings, and optical glass

  • Sample stage with strong expandability for multi-instrument combination for in-situ detection

  • One-click automatic scanning with programming for fast and automated detection

  • Stationary sample scanning with XYZ 3D motion measurement imaging

  • Gantry scanning head design, marble base, vacuum adsorption stage

  • Integrated mechanical vibration damping and environmental noise shielding solutions

  • Intelligent and fast needle insertion method for automatic detection of piezoelectric ceramics

  • Scanner nonlinear correction user editor for nano characterization and high measurement accuracy


  •  


 

Software

 

  1. Two sampling pixel options: 256×256, 512×512

  2. Execute scan area move and cut function to select any interesting area of the sample

  3. Scan sample in random angles at the beginning

  4. Real-time adjustment of the laser spot detection system

  5. Choose and set different color scanning images in the palette

  6. Support linear average and offset calibration in real-time for sample tilt

  7. Support scanner sensitivity calibration and electronic controller auto-calibration

  8. Support offline analysis and processing of sample images


  9.  


 

Company: Suzhou FlyingMan Precision Instruments Co., Ltd.




 High-Resolution Digital Microscope for Semiconductor Wafer
 
Product Parameters
Working mode Contact mode, Tapping mode Z Lifting table Stepper motor drive control with a minimum step size of 10nm
Optional mode Friction force/lateral force, amplitude/phase,magnetic force/electrostatic force Z Lifting stroke 20mm (optional 25mm)
Force spectrum curve F-Z force curve, RMS-Z curve Optical positioning 10X optical objective
XYZ Scanning method Probe driven XYZ scanning Camera 5 megapixel digital CMOS
XY Scanning Range Greater than  100um×100um Scan rate 0.6Hz~30Hz
Z Scan angle Greater than 10um Scan angle 0~360°
Scanning resolution Horizontal 0.2nm, vertical 0.05nm Operating environment Windows 10
operating system  
XY
Sample Stage
Stepper motor drive control, with a movement accuracy of 1um Communication interface USB2.0/3.0
XY
Shift motion
200×200mm(Optional 300×300mm) Instrument structure Gantry scanning head, marble base
Sample loading platform Dia 200mm(Optional 300mm) Damping method Air floating shock absorption acoustic shielding cover (optional active shock absorption platform)
Sample Weight ≤20Kg    

III. Main Technical Parameters



 

Founded in 2013, Suzhou FlyingMan Precision Instruments Co., Ltd. has been dedicated to producing high-quality instruments for laboratories and factories. Our focus has been on providing cutting-edge technology to meet the needs of various industries.



 

We offer an atomic force microscope designed for both educational and quality control purposes. Our AFM is known for its superior performance and reliability, making it the top choice for professionals seeking the best cost ratio in the market.

 
Detailed Photos
High-Resolution Digital Microscope for Semiconductor Wafer

High-Resolution Digital Microscope for Semiconductor WaferHigh-Resolution Digital Microscope for Semiconductor WaferHigh-Resolution Digital Microscope for Semiconductor Wafer

 

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Gold Member Since 2016

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Export Year
2015-01-01
OEM/ODM Availability
Yes