Cost-Efficient Nanoview Atomic Force Microscope

• Customization: Available
• After-sales Service: 1 Year
• Warranty: 1 Year
• Model NO.: FM-Nanoview TAPPING
• Magnification: >1000X
• Type: Video
• Number of Cylinder: Binoculars
• Mobility: Desktop
• Stereoscopic Effect: Stereoscopic Effect
• Kind of Light Source: Ordinary Light
• Shape: Single-lens
• Usage: Teaching
• Principle: Optics
• Principle of Optics: Polarizing Microscope
• Sample Size: Φ≤90mm,H≤20mm
• Max. Scan Range: X/Y: 20 Um, Z: 2 Um
• Resolution: X/Y:160;0.2 Nm, Z: 0.05nm
• Scan Rate: 0.6Hz~4.34Hz
• Feedback Type: DSP Digital Feedback
• PC Connection: USB2.0
• Windows: Compatible with Windows98/2000/XP/7/8
• Scan Angle: Random
• Sample Movement: 0~20mm
• Data Points: 256×256,512×512
• Transport Package: Carton and Wooden
• Specification: 55 lbs
• Trademark: flyingman
• Origin: China
• HS Code: 9011800090
• Production Capacity: 100pieces/Month

Product Description

Introducing the FM-NanoView TAPPING Atomic Force Microscope by Suzhou FlyingMan Precision Instruments Co., Ltd. A cost-efficient solution for high-quality imaging and analysis in research and educational settings.

 

Product Description

Product Description

Features

1. Scan head and sample stage designed together for strong anti-vibration performance


2. Precision laser detection and probe alignment device for easy laser adjustment


3. Servomotor drive for precise scanning area positioning


4. High-accuracy sample transfer device for scanning any area of interest


5. Optical observation system for tip check and sample positioning


6. Modular electronic system for easy maintenance and development


7. Spring vibration isolation for simple and effective performance

Software

1. Two sampling pixel options: 256×256, 512×512


2. Functionality for moving and cutting scan areas


3. Random angle scanning at the start


4. Real-time adjustment of laser spot detection system


5. Customizable scanning image colors in palette


6. Support for linear average and offset calibration


7. Scanner sensitivity and electronic controller auto-calibration


8. Offline analysis and processing of sample images

Manufactured by Suzhou FlyingMan Precision Instruments Co., Ltd.

  

Product Parameters

Main Technical Parameters

Explore the key technical specifications of the Cost-Efficient NanoView Atomic Force Microscope by Suzhou FlyingMan Precision Instruments Co., Ltd.

Item	Technical data	Item	Technical data
Operation modes	Contact mode, friction mode, extended modes of Tapping, phase, MFM, EFM.	Scan angle	Random
Sample size	Φ≤90mm,H≤20mm	Sample movement	0~20mm
Max. scan range	X/Y: 20 um, Z: 2 um	Pulse width of approaching  motor	10±2ms
Resolution	X/Y: 0.2 nm, Z: 0.05nm	Optical system	Magnification: 4X, resolution: 2.5 um
Scan rate	0.6Hz~4.34Hz	Data points	256×256,512×512
Scanning control	XY: 18-bit D/A, Z: 16-bit D/A	Feedback type	DSP digital feedback
Data sampling	One 14-bit A/D and double 16-bit A/D multiple-channel simultaneously
PC connection	USB2.0	Feedback sampling rate	64.0KHz
Windows	Compatible with Windows98/2000/XP/7/8

Atomic Force Microscope by Suzhou FlyingMan Precision Instruments Co., Ltd.

Atomic Force Microscope

Suzhou FlyingMan Precision Instruments Co., Ltd. has been specializing in building instruments for labs and factories since 2013. Our Atomic Force Microscope (AFM) is designed for physical education and wafer inspection, offering the best cost ratio in the market.

Features:

• High precision imaging for accurate analysis


• Easy to use interface for efficient operation


• Versatile applications in various industries

Benefits:

• Enhances research and development processes


• Improves quality control in manufacturing


• Cost-effective solution for advanced microscopy

 

Detailed Photos