Efficient Laboratory Scanning Atomic Force Microscope

• Customization: Available
• After-sales Service: 1 Year
• Warranty: 1 Year
• Model NO.: FM-Nanoview TAPPING
• Magnification: >1000X
• Type: Video
• Number of Cylinder: Binoculars
• Mobility: Desktop
• Stereoscopic Effect: Stereoscopic Effect
• Kind of Light Source: Ordinary Light
• Shape: Single-lens
• Usage: Teaching
• Principle: Optics
• Principle of Optics: Polarizing Microscope
• Sample Size: Φ≤90mm,H≤20mm
• Max. Scan Range: X/Y: 20 Um, Z: 2 Um
• Resolution: X/Y:160;0.2 Nm, Z: 0.05nm
• Scan Rate: 0.6Hz~4.34Hz
• Feedback Type: DSP Digital Feedback
• PC Connection: USB2.0
• Windows: Compatible with Windows98/2000/XP/7/8
• Scan Angle: Random
• Sample Movement: 0~20mm
• Data Points: 256×256,512×512
• Transport Package: Carton and Wooden
• Specification: 55 lbs
• Trademark: flyingman
• Origin: China
• HS Code: 9011800090
• Production Capacity: 100pieces/Month

Product Description

Introducing the FM-Nanoview TAPPING High Cost-efficiency Atomic Force Microscope from Suzhou FlyingMan Precision Instruments Co., Ltd. Ideal for efficient laboratory scanning, this advanced digital microscope offers high-quality imaging for professional education and research.

 

Product Description

Product Description

Features

1. Scan head and sample stage designed together for strong anti-vibration performance


2. Precision laser detection and probe alignment device for easy laser adjustment


3. Servomotor drive for precise scanning area positioning


4. High-accuracy and large range sample transfer device for scanning any area of interest


5. Optical observation system for tip check and sample positioning


6. Modular electronic system for easy maintenance and development


7. Spring vibration isolation for simple and effective performance

Software

1. Two sampling pixel options: 256×256, 512×512


2. Scan area move and cut function for selecting specific sample areas


3. Random angle scanning at the beginning


4. Real-time adjustment of laser spot detection system


5. Customizable scanning image colors in palette


6. Support for linear average and offset calibration


7. Scanner sensitivity and electronic controller auto-calibration


8. Offline analysis and processing of sample images

Manufactured by Suzhou FlyingMan Precision Instruments Co., Ltd.

  

Product Parameters

Main Technical Parameters

Explore the key technical specifications of the Efficient Laboratory Scanning Atomic Force Microscope by Suzhou FlyingMan Precision Instruments Co., Ltd.

Item	Technical data	Item	Technical data
Operation modes	Contact mode, friction mode, extended modes of Tapping, phase, MFM, EFM.	Scan angle	Random
Sample size	Φ≤90mm,H≤20mm	Sample movement	0~20mm
Max. scan range	X/Y: 20 um, Z: 2 um	Pulse width of approaching  motor	10±2ms
Resolution	X/Y: 0.2 nm, Z: 0.05nm	Optical system	Magnification: 4X, resolution: 2.5 um
Scan rate	0.6Hz~4.34Hz	Data points	256×256,512×512
Scanning control	XY: 18-bit D/A, Z: 16-bit D/A	Feedback type	DSP digital feedback
Data sampling	One 14-bit A/D and double 16-bit A/D multiple-channel simultaneously
PC connection	USB2.0	Feedback sampling rate	64.0KHz
Windows	Compatible with Windows98/2000/XP/7/8

Welcome to Suzhou FlyingMan Precision Instruments Co., Ltd.

Established in 2013, we have been dedicated to producing high-quality instruments for laboratories and factories. Our flagship product is the Atomic Force Microscope (AFM), designed for physical education and wafer inspection.

Key Features:

• Precision instrument for accurate measurements


• Cost-effective solution for various applications


• Reliable performance for consistent results

Experience the best cost ratio AFM with Suzhou FlyingMan Precision Instruments Co., Ltd. and elevate your research and inspection processes.

 

Detailed Photos