• Advanced Semiconductor Wafer Scanning Afm System
  • Advanced Semiconductor Wafer Scanning Afm System
  • Advanced Semiconductor Wafer Scanning Afm System
  • Advanced Semiconductor Wafer Scanning Afm System
  • Advanced Semiconductor Wafer Scanning Afm System
  • Advanced Semiconductor Wafer Scanning Afm System

Advanced Semiconductor Wafer Scanning Afm System

After-sales Service: 1 Year
Warranty: 1 Year
Magnification: >1000X
Type: Video
Number of Cylinder: Binoculars
Mobility: Desktop
Samples:
US$ 125000/Piece 1 Piece(Min.Order)
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Customization:
Gold Member Since 2016

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  • Overview
  • Product Description
  • Product Parameters
  • Detailed Photos
Overview

Basic Info.

Model NO.
LS AFM
Stereoscopic Effect
Stereoscopic Effect
Kind of Light Source
Ordinary Light
Shape
Single-lens
Usage
Teaching
Principle
Optics
Principle of Optics
Polarizing Microscope
Sample Size
Φ≤90mm,H≤20mm
Max. Scan Range
X/Y: 20 Um, Z: 2 Um
Resolution
X/Y:160;0.2 Nm, Z: 0.05nm
Scan Rate
0.6Hz~4.34Hz
Feedback Type
DSP Digital Feedback
PC Connection
USB2.0
Windows
Compatible with Windows98/2000/XP/7/8
Scan Angle
Random
Sample Movement
0~20mm
Data Points
256×256,512×512
Transport Package
Carton and Wooden
Specification
55 lbs
Trademark
flyingman
Origin
China
HS Code
9011800090
Production Capacity
100pieces/Month

Product Description


Advanced Semiconductor Wafer Scanning AFM System


Explore nano-scale semiconductor analysis with our high-resolution AFM scanner. Perfect for wafer topography mapping and defect detection.

Product Description






Atomic Force Microscope Features



Features



The first large-scale industrial atomic force microscope in China to achieve commercial production



  • The sample size and weight are almost unlimited, making it particularly suitable for testing large samples such as wafers, ultra large gratings, and optical glass

  • The sample stage has strong expandability and is very convenient for multi instrument combination to achieve in-situ detection

  • One click automatic scanning, capable of programming multiple test points for fast and automated detection

  • Keep the sample stationary while scanning the image, and drive the probe to perform XYZ 3D motion measurement imaging

  • Gantry scanning head design, marble base, vacuum adsorption stage

  • Integrated mechanical vibration damping and environmental noise shielding solutions greatly reduce system noise levels

  • Intelligent and fast needle insertion method for automatic detection of piezoelectric ceramics under motor control, protecting probes and samples

  • Scanner nonlinear correction user editor, with nano characterization and measurement accuracy better than 98%



Software



  1. Two kinds of sampling pixel for choose: 256×256, 512×512

  2. Execute scan area move and cut function, choose any interesting area of sample

  3. Scan sample in random angle at beginning

  4. Adjust the laser spot detection system in real time

  5. Choose and set different color of scanning image in palette

  6. Support linear average and offset calibration in real time for sample title

  7. Support scanner sensitivity calibration and electronic controller auto-calibration

  8. Support offline analysis and process of sample image



Company name: Suzhou FlyingMan Precision Instruments Co., Ltd.




 Advanced Semiconductor Wafer Scanning Afm System
 
Product Parameters
Working mode Contact mode, Tapping mode Z Lifting table Stepper motor drive control with a minimum step size of 10nm
Optional mode Friction force/lateral force, amplitude/phase,magnetic force/electrostatic force Z Lifting stroke 20mm (optional 25mm)
Force spectrum curve F-Z force curve, RMS-Z curve Optical positioning 10X optical objective
XYZ Scanning method Probe driven XYZ scanning Camera 5 megapixel digital CMOS
XY Scanning Range Greater than  100um×100um Scan rate 0.6Hz~30Hz
Z Scan angle Greater than 10um Scan angle 0~360°
Scanning resolution Horizontal 0.2nm, vertical 0.05nm Operating environment Windows 10
operating system  
XY
Sample Stage
Stepper motor drive control, with a movement accuracy of 1um Communication interface USB2.0/3.0
XY
Shift motion
200×200mm(Optional 300×300mm) Instrument structure Gantry scanning head, marble base
Sample loading platform Dia 200mm(Optional 300mm) Damping method Air floating shock absorption acoustic shielding cover (optional active shock absorption platform)
Sample Weight ≤20Kg    

Main Technical Parameters



Suzhou FlyingMan Precision Instruments Co., Ltd. (FSM) was established in 2013, specializing in the production of high-quality instruments for laboratories and factories. With a focus on innovation and precision, FSM offers an atomic force microscope designed for both educational purposes and wafer inspection.



The FSM atomic force microscope boasts the best cost ratio in the market, providing exceptional value for users seeking accurate and reliable measurements in their research and manufacturing processes.

 
Detailed Photos
Advanced Semiconductor Wafer Scanning Afm System

Advanced Semiconductor Wafer Scanning Afm SystemAdvanced Semiconductor Wafer Scanning Afm SystemAdvanced Semiconductor Wafer Scanning Afm System

 

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Gold Member Since 2016

Suppliers with verified business licenses

Export Year
2015-01-01
OEM/ODM Availability
Yes