Biological Microscope System for Semiconductor Wafer

• Customization: Available
• After-sales Service: 1 Year
• Warranty: 1 Year
• Model NO.: LS AFM
• Magnification: >1000X
• Type: Video
• Number of Cylinder: Binoculars
• Mobility: Desktop
• Stereoscopic Effect: Stereoscopic Effect
• Kind of Light Source: Ordinary Light
• Shape: Single-lens
• Usage: Teaching
• Principle: Optics
• Principle of Optics: Polarizing Microscope
• Sample Size: Φ≤90mm,H≤20mm
• Max. Scan Range: X/Y: 20 Um, Z: 2 Um
• Resolution: X/Y:160;0.2 Nm, Z: 0.05nm
• Scan Rate: 0.6Hz~4.34Hz
• Feedback Type: DSP Digital Feedback
• PC Connection: USB2.0
• Windows: Compatible with Windows98/2000/XP/7/8
• Scan Angle: Random
• Sample Movement: 0~20mm
• Data Points: 256×256,512×512
• Transport Package: Carton and Wooden
• Specification: 55 lbs
• Trademark: flyingman
• Origin: China
• HS Code: 9011800090
• Production Capacity: 100pieces/Month

Product Description

Suzhou FlyingMan Precision Instruments Co., Ltd. offers a cutting-edge Biological Microscope System tailored for the Semiconductor Wafer industry. This advanced microscope system provides high-resolution microscopy for wafer analysis, ensuring precise semiconductor inspection and analysis.

Product Description

Features

• The first large-scale industrial atomic force microscope in China to achieve commercial production


• Sample size and weight are almost unlimited, making it suitable for testing large samples such as wafers, ultra-large gratings, and optical glass


• Sample stage has strong expandability and is convenient for multi-instrument combination for in-situ detection


• One-click automatic scanning, capable of programming multiple test points for fast and automated detection


• Keeps the sample stationary while scanning the image and drives the probe to perform XYZ 3D motion measurement imaging


• Gantry scanning head design, marble base, vacuum adsorption stage


• Integrated mechanical vibration damping and environmental noise shielding solutions greatly reduce system noise levels


• Intelligent and fast needle insertion method for automatic detection of piezoelectric ceramics under motor control, protecting probes and samples


• Scanner nonlinear correction user editor, with nano characterization and measurement accuracy better than 98%

Software

1. Two kinds of sampling pixel to choose from: 256x256, 512x512


2. Execute scan area move and cut function, choose any interesting area of the sample


3. Scan sample in random angle at the beginning


4. Adjust the laser spot detection system in real-time


5. Choose and set different colors of scanning image in palette


6. Support linear average and offset calibration in real-time for sample title


7. Support scanner sensitivity calibration and electronic controller auto-calibration


8. Support offline analysis and process of sample image

Company name: 'Suzhou FlyingMan Precision Instruments Co., Ltd.'

 
 

Product Parameters

Working mode	Contact mode, Tapping mode	Z Lifting table	Stepper motor drive control with a minimum step size of 10nm
Optional mode	Friction force/lateral force, amplitude/phase,magnetic force/electrostatic force	Z Lifting stroke	20mm (optional 25mm)
Force spectrum curve	F-Z force curve, RMS-Z curve	Optical positioning	10X optical objective
XYZ Scanning method	Probe driven XYZ scanning	Camera	5 megapixel digital CMOS
XY Scanning Range	Greater than  100um×100um	Scan rate	0.6Hz~30Hz
Z Scan angle	Greater than 10um	Scan angle	0~360°
Scanning resolution	Horizontal 0.2nm, vertical 0.05nm	Operating environment	Windows 10 operating system
XY Sample Stage	Stepper motor drive control, with a movement accuracy of 1um	Communication interface	USB2.0/3.0
XY Shift motion	200×200mm(Optional 300×300mm)	Instrument structure	Gantry scanning head, marble base
Sample loading platform	Dia 200mm(Optional 300mm)	Damping method	Air floating shock absorption acoustic shielding cover (optional active shock absorption platform)
Sample Weight	≤20Kg

Technical Specifications

• Company: Suzhou FlyingMan Precision Instruments Co., Ltd.


• Established: 2013


• Focus: Lab and factory instruments


• Product: Atomic Force Microscope (AFM)


• Applications: Physical education and wafer inspection


• Cost Ratio: Best in class

 

Detailed Photos