Laboratory Grade Afm System for Semiconductor Analysis

• After-sales Service: 1 Year
• Warranty: 1 Year
• Magnification: >1000X
• Type: Video
• Number of Cylinder: Binoculars
• Mobility: Desktop
• Model NO.: LS AFM
• Stereoscopic Effect: Stereoscopic Effect
• Kind of Light Source: Ordinary Light
• Shape: Single-lens
• Usage: Teaching
• Principle: Optics
• Principle of Optics: Polarizing Microscope
• Sample Size: Φ≤90mm,H≤20mm
• Max. Scan Range: X/Y: 20 Um, Z: 2 Um
• Resolution: X/Y:160;0.2 Nm, Z: 0.05nm
• Scan Rate: 0.6Hz~4.34Hz
• Feedback Type: DSP Digital Feedback
• PC Connection: USB2.0
• Windows: Compatible with Windows98/2000/XP/7/8
• Scan Angle: Random
• Sample Movement: 0~20mm
• Data Points: 256×256,512×512
• Transport Package: Carton and Wooden
• Specification: 55 lbs
• Trademark: flyingman
• Origin: China
• HS Code: 9011800090
• Production Capacity: 100pieces/Month

Product Description

Product Name: Laboratory Grade AFM System for Semiconductor Analysis

Company Name: Suzhou FlyingMan Precision Instruments Co., Ltd.

Keywords: High-resolution digital microscope, Advanced teaching microscope, Cutting-edge laboratory instrument, Precision semiconductor inspection, Research-grade materials analysis, User-friendly microscope interface, Cost-effective semiconductor analysis

Description: Explore our AFM system for semiconductor analysis, offering high-resolution imaging and precise inspection. Ideal for research and education.

Product Description

Atomic Force Microscope Features

Features

• The first large-scale industrial atomic force microscope in China to achieve commercial production


• Capable of testing large samples such as wafers, ultra large gratings, and optical glass


• Sample stage with strong expandability for multi instrument combination


• One click automatic scanning for fast and automated detection


• XYZ 3D motion measurement imaging with stationary sample scanning


• Gantry scanning head design, marble base, vacuum adsorption stage


• Mechanical vibration damping and noise shielding solutions for reduced system noise levels


• Intelligent needle insertion method for automatic detection of piezoelectric ceramics


• Scanner nonlinear correction user editor for nano characterization and high measurement accuracy

Software

1. Two sampling pixel options: 256×256, 512×512


2. Execute scan area move and cut function


3. Scan sample in random angle at beginning


4. Real-time adjustment of laser spot detection system


5. Choose and set different color of scanning image in palette


6. Support linear average and offset calibration in real time


7. Scanner sensitivity calibration and electronic controller auto-calibration


8. Support offline analysis and processing of sample image

Company name: Suzhou FlyingMan Precision Instruments Co., Ltd.

 
 

Product Parameters

Working mode	Contact mode, Tapping mode	Z Lifting table	Stepper motor drive control with a minimum step size of 10nm
Optional mode	Friction force/lateral force, amplitude/phase,magnetic force/electrostatic force	Z Lifting stroke	20mm (optional 25mm)
Force spectrum curve	F-Z force curve, RMS-Z curve	Optical positioning	10X optical objective
XYZ Scanning method	Probe driven XYZ scanning	Camera	5 megapixel digital CMOS
XY Scanning Range	Greater than  100um×100um	Scan rate	0.6Hz~30Hz
Z Scan angle	Greater than 10um	Scan angle	0~360°
Scanning resolution	Horizontal 0.2nm, vertical 0.05nm	Operating environment	Windows 10 operating system
XY Sample Stage	Stepper motor drive control, with a movement accuracy of 1um	Communication interface	USB2.0/3.0
XY Shift motion	200×200mm(Optional 300×300mm)	Instrument structure	Gantry scanning head, marble base
Sample loading platform	Dia 200mm(Optional 300mm)	Damping method	Air floating shock absorption acoustic shielding cover (optional active shock absorption platform)
Sample Weight	≤20Kg

Technical Specifications

• Company: Suzhou FlyingMan Precision Instruments Co., Ltd.


• Year Built: 2013


• Focus: Instruments for labs and factories

Product Description

Suzhou FlyingMan Precision Instruments Co., Ltd. has been dedicated to producing high-quality instruments for the past 9 years. Our Atomic Force Microscope (AFM) is designed for both physical education and wafer inspection purposes. With the best cost ratio in the market, our AFM offers unparalleled precision and reliability.

 

Detailed Photos