Ls-Afm Atomic Force Microscope System for Semiconductor Wafer Scanning

Product Details
Customization: Available
After-sales Service: 1 Year
Warranty: 1 Year
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Export Year
2015-01-01
OEM/ODM Availability
Yes
  • Ls-Afm Atomic Force Microscope System for Semiconductor Wafer Scanning
  • Ls-Afm Atomic Force Microscope System for Semiconductor Wafer Scanning
  • Ls-Afm Atomic Force Microscope System for Semiconductor Wafer Scanning
  • Ls-Afm Atomic Force Microscope System for Semiconductor Wafer Scanning
  • Ls-Afm Atomic Force Microscope System for Semiconductor Wafer Scanning
  • Ls-Afm Atomic Force Microscope System for Semiconductor Wafer Scanning
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  • Overview
  • Product Description
  • Product Parameters
  • Detailed Photos
Overview

Basic Info.

Model NO.
LS AFM
Magnification
>1000X
Type
Video
Number of Cylinder
Binoculars
Mobility
Desktop
Stereoscopic Effect
Stereoscopic Effect
Kind of Light Source
Ordinary Light
Shape
Single-lens
Usage
Teaching
Principle
Optics
Principle of Optics
Polarizing Microscope
Sample Size
Φ≤90mm,H≤20mm
Max. Scan Range
X/Y: 20 Um, Z: 2 Um
Resolution
X/Y:160;0.2 Nm, Z: 0.05nm
Scan Rate
0.6Hz~4.34Hz
Feedback Type
DSP Digital Feedback
PC Connection
USB2.0
Windows
Compatible with Windows98/2000/XP/7/8
Scan Angle
Random
Sample Movement
0~20mm
Data Points
256×256,512×512
Transport Package
Carton and Wooden
Specification
55 lbs
Trademark
flyingman
Origin
China
HS Code
9011800090
Production Capacity
100pieces/Month

Packaging & Delivery

Package Size
55.00cm * 55.00cm * 115.00cm
Package Gross Weight
65.000kg
Lead Time
90 days (1 - 1 Pieces)
To be negotiated ( > 1 Pieces)

Product Description


 Atomic Force Microscope For Wafer Industry Type
Product Description

 

 




I. Features

The first large-scale industrial atomic force microscope in China to achieve commercial production
·The sample size and weight are almost unlimited, making it particularly suitable for testing large samples such as wafers, ultra large gratings, and optical glass
·The sample stage has strong expandability and is very convenient for multi instrument combination to achieve in-situ detection
·One click automatic scanning, capable of programming multiple test points for fast and automated detection
·Keep the sample stationary while scanning the image, and drive the probe to perform XYZ 3D motion measurement imaging
·Gantry scanning head design, marble base, vacuum adsorption stage
·Integrated mechanical vibration damping and environmental noise shielding solutions greatly reduce system noise levels
·Intelligent and fast needle insertion method for automatic detection of piezoelectric ceramics under motor control, protecting probes and samples
·Scanner nonlinear correction user editor, with nano characterization and measurement accuracy better than 98%




 
II. Software
1.  Two kinds of sampling pixel for choose: 256×256, 512×512;
2.  Execute scan area move and cut function, choose any interesting area of sample;
3.  Scan sample in random angle at beginning;
4.  Adjust the laser spot detection system in real time;
5.  Choose and set different color of scanning image in palette.
6.  Support linear average and offset calibration in real time for sample title;
7.  Support scanner sensitivity calibration and electronic controller auto-calibration;
8.  Support offline analysis and process of sample image.

Ls-Afm Atomic Force Microscope System for Semiconductor Wafer Scanning
 
Product Parameters

 

Working mode Contact mode, Tapping mode Z Lifting table Stepper motor drive control with a minimum step size of 10nm
Optional mode Friction force/lateral force, amplitude/phase,magnetic force/electrostatic force Z Lifting stroke 20mm (optional 25mm)
Force spectrum curve F-Z force curve, RMS-Z curve Optical positioning 10X optical objective
XYZ Scanning method Probe driven XYZ scanning Camera 5 megapixel digital CMOS
XY Scanning Range Greater than  100um×100um Scan rate 0.6Hz~30Hz
Z Scan angle Greater than 10um Scan angle 0~360°
Scanning resolution Horizontal 0.2nm, vertical 0.05nm Operating environment Windows 10
operating system  
XY
Sample Stage
Stepper motor drive control, with a movement accuracy of 1um Communication interface USB2.0/3.0
XY
Shift motion
200×200mm(Optional 300×300mm) Instrument structure Gantry scanning head, marble base
Sample loading platform Dia 200mm(Optional 300mm) Damping method Air floating shock absorption acoustic shielding cover (optional active shock absorption platform)
Sample Weight ≤20Kg    
III. Main technical parameters

FSM built in 2013. In the past 9 years, we concentrate on making instruments for labs and factories.
We provide atomic force microscope for normal physical education and wifer inspection.
It is the best cost ratio AFM.
 
Detailed Photos

 

Ls-Afm Atomic Force Microscope System for Semiconductor Wafer Scanning

Ls-Afm Atomic Force Microscope System for Semiconductor Wafer ScanningLs-Afm Atomic Force Microscope System for Semiconductor Wafer ScanningLs-Afm Atomic Force Microscope System for Semiconductor Wafer Scanning

Why choose us?
1.Over many years' experience in production and service.
2.We are manufacturer who can give you Preferential price
3.ISO9001 certified.
4.lifetime after sales service warranty.
5.OEM service is available.
6. Strict quality inspection before shipment. 
 

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