Cost-Efficient Nanoview Tapping Afm Instrument

• Customization: Available
• After-sales Service: 1 Year
• Warranty: 1 Year
• Model NO.: FM-Nanoview TAPPING
• Magnification: >1000X
• Type: Video
• Number of Cylinder: Binoculars
• Mobility: Desktop
• Stereoscopic Effect: Stereoscopic Effect
• Kind of Light Source: Ordinary Light
• Shape: Single-lens
• Usage: Teaching
• Principle: Optics
• Principle of Optics: Polarizing Microscope
• Sample Size: Φ≤90mm,H≤20mm
• Max. Scan Range: X/Y: 20 Um, Z: 2 Um
• Resolution: X/Y:160;0.2 Nm, Z: 0.05nm
• Scan Rate: 0.6Hz~4.34Hz
• Feedback Type: DSP Digital Feedback
• PC Connection: USB2.0
• Windows: Compatible with Windows98/2000/XP/7/8
• Scan Angle: Random
• Sample Movement: 0~20mm
• Data Points: 256×256,512×512
• Transport Package: Carton and Wooden
• Specification: 55 lbs
• Trademark: flyingman
• Origin: China
• HS Code: 9011800090
• Production Capacity: 100pieces/Month

Product Description

Introducing the FM-NanoView TAPPING High Cost-efficiency Atomic Force Microscope by Suzhou FlyingMan Precision Instruments Co., Ltd. Ideal for advanced biological microscopy and high-quality educational purposes.

 

Product Description

Product Description

Welcome to Suzhou FlyingMan Precision Instruments Co., Ltd.

Features:

1. Scan head and sample stage designed together for strong anti-vibration performance.


2. Precision laser detection and probe alignment device for easy laser adjustment.


3. Servomotor drive for precise scanning area positioning.


4. High-accuracy sample transfer device for scanning any area of interest.


5. Optical observation system for tip check and sample positioning.


6. Modular electronic system for easy maintenance and development.


7. Spring vibration isolation for simple and effective performance.

Software:

1. Two sampling pixel options: 256×256, 512×512.


2. Functionality for scan area move and cut, selecting any area of interest.


3. Random angle scanning initiation.


4. Real-time adjustment of laser spot detection system.


5. Palette options for different scanning image colors.


6. Support for linear average and offset calibration in real time.


7. Scanner sensitivity and electronic controller auto-calibration.


8. Offline analysis and processing of sample images.

Explore our cutting-edge product designed to meet your precision scanning needs.

  

Product Parameters

III. Main Technical Parameters

Explore the key technical specifications of the Cost-Efficient NanoView Tapping AFM Instrument by Suzhou FlyingMan Precision Instruments Co., Ltd.

Item	Technical data	Item	Technical data
Operation modes	Contact mode, friction mode, extended modes of Tapping, phase, MFM, EFM.	Scan angle	Random
Sample size	Φ≤90mm,H≤20mm	Sample movement	0~20mm
Max. scan range	X/Y: 20 um, Z: 2 um	Pulse width of approaching  motor	10±2ms
Resolution	X/Y: 0.2 nm, Z: 0.05nm	Optical system	Magnification: 4X, resolution: 2.5 um
Scan rate	0.6Hz~4.34Hz	Data points	256×256,512×512
Scanning control	XY: 18-bit D/A, Z: 16-bit D/A	Feedback type	DSP digital feedback
Data sampling	One 14-bit A/D and double 16-bit A/D multiple-channel simultaneously
PC connection	USB2.0	Feedback sampling rate	64.0KHz
Windows	Compatible with Windows98/2000/XP/7/8

Welcome to Suzhou FlyingMan Precision Instruments Co., Ltd.

Established in 2013, we specialize in creating high-quality instruments for laboratories and factories. Our flagship product is the Atomic Force Microscope (AFM), designed for both educational and wafer inspection purposes.

Key Features:

• State-of-the-art technology for precise measurements


• Cost-effective solution for AFM needs


• Reliable performance for consistent results

Benefits:

• Enhances physical education curriculum


• Ensures accurate wafer inspection for quality control


• Optimizes cost efficiency with the best cost ratio AFM

Experience the superior quality and performance of our AFM for your lab or factory needs. Contact us today to learn more!

 

Detailed Photos