Nanoview High Resolution Atomic Force Microscope

• Customization: Available
• After-sales Service: 1 Year
• Warranty: 1 Year
• Model NO.: FM-Nanoview TAPPING
• Magnification: >1000X
• Type: Video
• Number of Cylinder: Binoculars
• Mobility: Desktop
• Stereoscopic Effect: Stereoscopic Effect
• Kind of Light Source: Ordinary Light
• Shape: Single-lens
• Usage: Teaching
• Principle: Optics
• Principle of Optics: Polarizing Microscope
• Sample Size: Φ≤90mm,H≤20mm
• Max. Scan Range: X/Y: 20 Um, Z: 2 Um
• Resolution: X/Y:160;0.2 Nm, Z: 0.05nm
• Scan Rate: 0.6Hz~4.34Hz
• Feedback Type: DSP Digital Feedback
• PC Connection: USB2.0
• Windows: Compatible with Windows98/2000/XP/7/8
• Scan Angle: Random
• Sample Movement: 0~20mm
• Data Points: 256×256,512×512
• Transport Package: Carton and Wooden
• Specification: 55 lbs
• Trademark: flyingman
• Origin: China
• HS Code: 9011800090
• Production Capacity: 100pieces/Month

Product Description

Introducing the FM-Nanoview TAPPING High Cost-efficiency Atomic Force Microscope by Suzhou FlyingMan Precision Instruments Co., Ltd. Ideal for advanced research and professional scientific use.

 

Product Description

Product Description

Welcome to Suzhou FlyingMan Precision Instruments Co., Ltd.

Features:

1. Scan head and sample stage designed together for strong anti-vibration performance.


2. Precision laser detection and probe alignment device for easy laser adjustment.


3. Servomotor-driven sample approaching tip for precision scanning area positioning.


4. High-accuracy and large range sample transfer device for scanning any area of interest.


5. Optical observation system for tip check and sample positioning.


6. Modular electronic system for easy maintenance and development.


7. Spring vibration isolation for simple and effective performance.

Software:

1. Two sampling pixel options: 256x256, 512x512.


2. Scan area move and cut function for selecting specific sample areas.


3. Random angle scanning at the beginning.


4. Real-time adjustment of laser spot detection system.


5. Customizable scanning image colors in palette.


6. Support for linear average and offset calibration in real time.


7. Scanner sensitivity calibration and electronic controller auto-calibration.


8. Offline analysis and processing of sample images.

Contact us at Suzhou FlyingMan Precision Instruments Co., Ltd. for more information on our innovative product offerings.

  

Product Parameters

III. Main Technical Parameters

Explore the technical specifications of the NanoView High Resolution Atomic Force Microscope by Suzhou FlyingMan Precision Instruments Co., Ltd.

Item	Technical data	Item	Technical data
Operation modes	Contact mode, friction mode, extended modes of Tapping, phase, MFM, EFM.	Scan angle	Random
Sample size	Φ≤90mm,H≤20mm	Sample movement	0~20mm
Max. scan range	X/Y: 20 um, Z: 2 um	Pulse width of approaching  motor	10±2ms
Resolution	X/Y: 0.2 nm, Z: 0.05nm	Optical system	Magnification: 4X, resolution: 2.5 um
Scan rate	0.6Hz~4.34Hz	Data points	256×256,512×512
Scanning control	XY: 18-bit D/A, Z: 16-bit D/A	Feedback type	DSP digital feedback
Data sampling	One 14-bit A/D and double 16-bit A/D multiple-channel simultaneously
PC connection	USB2.0	Feedback sampling rate	64.0KHz
Windows	Compatible with Windows98/2000/XP/7/8

Founded in 2013, Suzhou FlyingMan Precision Instruments Co., Ltd. specializes in creating cutting-edge instruments for laboratories and factories. Our flagship product is the Atomic Force Microscope, designed for both educational purposes and wafer inspection. With its superior quality and affordability, it offers the best cost ratio in the market.

 

Detailed Photos