Educational Atomic Force Microscope for Semiconductor

• After-sales Service: 1 Year
• Warranty: 1 Year
• Magnification: >1000X
• Type: Video
• Number of Cylinder: Binoculars
• Mobility: Desktop
• Model NO.: LS AFM
• Stereoscopic Effect: Stereoscopic Effect
• Kind of Light Source: Ordinary Light
• Shape: Single-lens
• Usage: Teaching
• Principle: Optics
• Principle of Optics: Polarizing Microscope
• Sample Size: Φ≤90mm,H≤20mm
• Max. Scan Range: X/Y: 20 Um, Z: 2 Um
• Resolution: X/Y:160;0.2 Nm, Z: 0.05nm
• Scan Rate: 0.6Hz~4.34Hz
• Feedback Type: DSP Digital Feedback
• PC Connection: USB2.0
• Windows: Compatible with Windows98/2000/XP/7/8
• Scan Angle: Random
• Sample Movement: 0~20mm
• Data Points: 256×256,512×512
• Transport Package: Carton and Wooden
• Specification: 55 lbs
• Trademark: flyingman
• Origin: China
• HS Code: 9011800090
• Production Capacity: 100pieces/Month

Product Description

Educational Atomic Force Microscope for Semiconductor by Suzhou FlyingMan Precision Instruments Co., Ltd. Ideal for advanced digital microscopy in the wafer industry.

Product Description

Atomic Force Microscope

Features

• The first large-scale industrial atomic force microscope in China for commercial production


• Capable of testing large samples like wafers, ultra large gratings, and optical glass


• Sample stage with strong expandability for multi-instrument combination


• One-click automatic scanning with programming for fast detection


• XYZ 3D motion measurement imaging with stationary sample


• Gantry scanning head design with marble base and vacuum adsorption stage


• Mechanical vibration damping and noise shielding solutions for reduced system noise levels


• Intelligent needle insertion method for automatic detection of piezoelectric ceramics


• Scanner nonlinear correction user editor for nano characterization and high measurement accuracy

Software

1. Two sampling pixel options: 256×256, 512×512


2. Scan area move and cut function for selecting sample areas


3. Random angle scanning at the beginning


4. Real-time adjustment of laser spot detection system


5. Selection of different color scanning images in palette


6. Support for linear average and offset calibration in real-time


7. Scanner sensitivity calibration and electronic controller auto-calibration


8. Offline analysis and processing of sample images

Company: Suzhou FlyingMan Precision Instruments Co., Ltd.

 
 

Product Parameters

Working mode	Contact mode, Tapping mode	Z Lifting table	Stepper motor drive control with a minimum step size of 10nm
Optional mode	Friction force/lateral force, amplitude/phase,magnetic force/electrostatic force	Z Lifting stroke	20mm (optional 25mm)
Force spectrum curve	F-Z force curve, RMS-Z curve	Optical positioning	10X optical objective
XYZ Scanning method	Probe driven XYZ scanning	Camera	5 megapixel digital CMOS
XY Scanning Range	Greater than  100um×100um	Scan rate	0.6Hz~30Hz
Z Scan angle	Greater than 10um	Scan angle	0~360°
Scanning resolution	Horizontal 0.2nm, vertical 0.05nm	Operating environment	Windows 10 operating system
XY Sample Stage	Stepper motor drive control, with a movement accuracy of 1um	Communication interface	USB2.0/3.0
XY Shift motion	200×200mm(Optional 300×300mm)	Instrument structure	Gantry scanning head, marble base
Sample loading platform	Dia 200mm(Optional 300mm)	Damping method	Air floating shock absorption acoustic shielding cover (optional active shock absorption platform)
Sample Weight	≤20Kg

Main Technical Parameters

Founded in 2013, Suzhou FlyingMan Precision Instruments Co., Ltd. has been dedicated to producing high-quality instruments for laboratories and factories for the past 9 years.

We specialize in providing atomic force microscopes for various applications, including physical education and wafer inspection. Our AFM offers the best cost ratio in the market, ensuring top-notch performance at an affordable price.

 

Detailed Photos