Nano-Resolution Semiconductor Wafer Afm Microscope

Product Details
Customization: Available
After-sales Service: 1 Year
Warranty: 1 Year
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Export Year
2015-01-01
OEM/ODM Availability
Yes
  • Nano-Resolution Semiconductor Wafer Afm Microscope
  • Nano-Resolution Semiconductor Wafer Afm Microscope
  • Nano-Resolution Semiconductor Wafer Afm Microscope
  • Nano-Resolution Semiconductor Wafer Afm Microscope
  • Nano-Resolution Semiconductor Wafer Afm Microscope
  • Nano-Resolution Semiconductor Wafer Afm Microscope
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  • Overview
  • Product Description
  • Product Parameters
  • Detailed Photos
Overview

Basic Info.

Model NO.
LS AFM
Type
Video
Number of Cylinder
Binoculars
Mobility
Desktop
Stereoscopic Effect
Stereoscopic Effect
Kind of Light Source
Ordinary Light
Shape
Single-lens
Usage
Teaching
Principle
Optics
Principle of Optics
Polarizing Microscope
Sample Size
Φ≤90mm,H≤20mm
Max. Scan Range
X/Y: 20 Um, Z: 2 Um
Resolution
X/Y:160;0.2 Nm, Z: 0.05nm
Scan Rate
0.6Hz~4.34Hz
Feedback Type
DSP Digital Feedback
PC Connection
USB2.0
Windows
Compatible with Windows98/2000/XP/7/8
Scan Angle
Random
Sample Movement
0~20mm
Data Points
256×256,512×512
Transport Package
Carton and Wooden
Specification
55 lbs
Trademark
flyingman
Origin
China
HS Code
9011800090
Production Capacity
100pieces/Month

Packaging & Delivery

Package Size
55.00cm * 55.00cm * 105.00cm
Package Gross Weight
60.000kg

Product Description

 

Suzhou FlyingMan Precision Instruments Co., Ltd. presents the Nano-Resolution Semiconductor Wafer AFM Microscope for high-quality imaging and analysis in the wafer industry.

Product Description




 

Features

 

  • The first large-scale industrial atomic force microscope in China to achieve commercial production

  • Capable of testing large samples such as wafers, ultra large gratings, and optical glass

  • Sample stage with strong expandability for multi instrument combination

  • One-click automatic scanning for fast and automated detection

  • XYZ 3D motion measurement imaging with stationary sample

  • Gantry scanning head design with marble base and vacuum adsorption stage

  • Mechanical vibration damping and environmental noise shielding solutions

  • Intelligent needle insertion method for automatic detection of piezoelectric ceramics

  • Scanner nonlinear correction user editor for nano characterization and high measurement accuracy


  •  


 

Software

 

  1. Two sampling pixel options: 256×256, 512×512

  2. Execute scan area move and cut function

  3. Scan sample in random angle at beginning

  4. Real-time adjustment of laser spot detection system

  5. Choose and set different color of scanning image in palette

  6. Support linear average and offset calibration in real time for sample title

  7. Scanner sensitivity calibration and electronic controller auto-calibration

  8. Support offline analysis and process of sample image


  9.  


 

Company: Suzhou FlyingMan Precision Instruments Co., Ltd.


 Nano-Resolution Semiconductor Wafer Afm Microscope
 
Product Parameters
Working mode Contact mode, Tapping mode Z Lifting table Stepper motor drive control with a minimum step size of 10nm
Optional mode Friction force/lateral force, amplitude/phase,magnetic force/electrostatic force Z Lifting stroke 20mm (optional 25mm)
Force spectrum curve F-Z force curve, RMS-Z curve Optical positioning 10X optical objective
XYZ Scanning method Probe driven XYZ scanning Camera 5 megapixel digital CMOS
XY Scanning Range Greater than  100um×100um Scan rate 0.6Hz~30Hz
Z Scan angle Greater than 10um Scan angle 0~360°
Scanning resolution Horizontal 0.2nm, vertical 0.05nm Operating environment Windows 10
operating system  
XY
Sample Stage
Stepper motor drive control, with a movement accuracy of 1um Communication interface USB2.0/3.0
XY
Shift motion
200×200mm(Optional 300×300mm) Instrument structure Gantry scanning head, marble base
Sample loading platform Dia 200mm(Optional 300mm) Damping method Air floating shock absorption acoustic shielding cover (optional active shock absorption platform)
Sample Weight ≤20Kg    

III. Main Technical Parameters



 

Suzhou FlyingMan Precision Instruments Co., Ltd. introduced the FSM in 2013. With a focus on creating instruments for laboratories and factories over the past 9 years, we offer an atomic force microscope designed for physical education and wafer inspection purposes. Our AFM boasts the best cost ratio in the market, making it a top choice for various applications.

 
Detailed Photos
Nano-Resolution Semiconductor Wafer Afm Microscope

Nano-Resolution Semiconductor Wafer Afm MicroscopeNano-Resolution Semiconductor Wafer Afm MicroscopeNano-Resolution Semiconductor Wafer Afm Microscope

 

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