Nano-Resolution Semiconductor Wafer Afm Microscope

• Customization: Available
• After-sales Service: 1 Year
• Warranty: 1 Year
• Model NO.: LS AFM
• Magnification: >1000X
• Type: Video
• Number of Cylinder: Binoculars
• Mobility: Desktop
• Stereoscopic Effect: Stereoscopic Effect
• Kind of Light Source: Ordinary Light
• Shape: Single-lens
• Usage: Teaching
• Principle: Optics
• Principle of Optics: Polarizing Microscope
• Sample Size: Φ≤90mm,H≤20mm
• Max. Scan Range: X/Y: 20 Um, Z: 2 Um
• Resolution: X/Y:160;0.2 Nm, Z: 0.05nm
• Scan Rate: 0.6Hz~4.34Hz
• Feedback Type: DSP Digital Feedback
• PC Connection: USB2.0
• Windows: Compatible with Windows98/2000/XP/7/8
• Scan Angle: Random
• Sample Movement: 0~20mm
• Data Points: 256×256,512×512
• Transport Package: Carton and Wooden
• Specification: 55 lbs
• Trademark: flyingman
• Origin: China
• HS Code: 9011800090
• Production Capacity: 100pieces/Month
• Package Size: 55.00cm * 55.00cm * 105.00cm
• Package Gross Weight: 60.000kg

Product Description

 

Suzhou FlyingMan Precision Instruments Co., Ltd. presents the Nano-Resolution Semiconductor Wafer AFM Microscope for high-quality imaging and analysis in the wafer industry.

Product Description

 

Features

 

• The first large-scale industrial atomic force microscope in China to achieve commercial production


• Capable of testing large samples such as wafers, ultra large gratings, and optical glass


• Sample stage with strong expandability for multi instrument combination


• One-click automatic scanning for fast and automated detection


• XYZ 3D motion measurement imaging with stationary sample


• Gantry scanning head design with marble base and vacuum adsorption stage


• Mechanical vibration damping and environmental noise shielding solutions


• Intelligent needle insertion method for automatic detection of piezoelectric ceramics


• Scanner nonlinear correction user editor for nano characterization and high measurement accuracy


 

 

Software

 

1. Two sampling pixel options: 256×256, 512×512


2. Execute scan area move and cut function


3. Scan sample in random angle at beginning


4. Real-time adjustment of laser spot detection system


5. Choose and set different color of scanning image in palette


6. Support linear average and offset calibration in real time for sample title


7. Scanner sensitivity calibration and electronic controller auto-calibration


8. Support offline analysis and process of sample image


 

 

Company: Suzhou FlyingMan Precision Instruments Co., Ltd.

 
 

Product Parameters

Working mode	Contact mode, Tapping mode	Z Lifting table	Stepper motor drive control with a minimum step size of 10nm
Optional mode	Friction force/lateral force, amplitude/phase,magnetic force/electrostatic force	Z Lifting stroke	20mm (optional 25mm)
Force spectrum curve	F-Z force curve, RMS-Z curve	Optical positioning	10X optical objective
XYZ Scanning method	Probe driven XYZ scanning	Camera	5 megapixel digital CMOS
XY Scanning Range	Greater than  100um×100um	Scan rate	0.6Hz~30Hz
Z Scan angle	Greater than 10um	Scan angle	0~360°
Scanning resolution	Horizontal 0.2nm, vertical 0.05nm	Operating environment	Windows 10 operating system
XY Sample Stage	Stepper motor drive control, with a movement accuracy of 1um	Communication interface	USB2.0/3.0
XY Shift motion	200×200mm(Optional 300×300mm)	Instrument structure	Gantry scanning head, marble base
Sample loading platform	Dia 200mm(Optional 300mm)	Damping method	Air floating shock absorption acoustic shielding cover (optional active shock absorption platform)
Sample Weight	≤20Kg

III. Main Technical Parameters

 

Suzhou FlyingMan Precision Instruments Co., Ltd. introduced the FSM in 2013. With a focus on creating instruments for laboratories and factories over the past 9 years, we offer an atomic force microscope designed for physical education and wafer inspection purposes. Our AFM boasts the best cost ratio in the market, making it a top choice for various applications.

 

Detailed Photos