FM-Nanoview Tapping Teaching Atomic Force Microscope

• Customization: Available
• After-sales Service: 1 Year
• Warranty: 1 Year
• Model NO.: FM-Nanoview TAPPING
• Magnification: >1000X
• Type: Video
• Number of Cylinder: Binoculars
• Mobility: Desktop
• Stereoscopic Effect: Stereoscopic Effect
• Kind of Light Source: Ordinary Light
• Shape: Single-lens
• Usage: Teaching
• Principle: Optics
• Principle of Optics: Polarizing Microscope
• Sample Size: Φ≤90mm,H≤20mm
• Max. Scan Range: X/Y: 20 Um, Z: 2 Um
• Resolution: X/Y: 0.2 Nm, Z: 0.05nm
• Scan Rate: 0.6Hz~4.34Hz
• Feedback Type: DSP Digital Feedback
• PC Connection: USB2.0
• Windows: Compatible with Windows98/2000/XP/7/8
• Scan Angle: Random
• Sample Movement: 0~20mm
• Data Points: 256×256,512×512
• Transport Package: Carton and Wooden
• Specification: 55 lbs
• Trademark: flyingman
• Origin: China
• HS Code: 9011800090
• Production Capacity: 100pieces/Month
• Package Size: 55.00cm * 55.00cm * 105.00cm
• Package Gross Weight: 65.000kg

Product Description

FM-Nanoview 1000 flyingman AFM Atomic Force Microscope
 

Product Description

 

 

I. Features
1. Scan head and sample stage are designed together, strong anti-vibration performance 
2. Precision laser detection and probe alignment device make laser adjustment simple and easy;
3. Adapt servomotor to drive the sample approaching tip manually or automatically, to realize precision scanning area positioning.
4. High-accuracy and large range sample transfer device allow to scan any interesting area of sample ;
5. Optical observation system for tip check and sample positioning.
6. Electronic system is designed as modular and easy for maintenance and further development.
7. Adopt spring for vibration isolation, simple and good performance. 
 
II. Software
1.  Two kinds of sampling pixel for choose: 256×256, 512×512;
2.  Execute scan area move and cut function, choose any interesting area of sample;
3.  Scan sample in random angle at beginning;
4.  Adjust the laser spot detection system in real time;
5.  Choose and set different color of scanning image in palette.
6.  Support linear average and offset calibration in real time for sample title;
7.  Support scanner sensitivity calibration and electronic controller auto-calibration;
8.  Support offline analysis and process of sample image.
 

Product Parameters

 

III. Main technical parameters

Item	Technical data	Item	Technical data
Operation modes	Contact mode, friction mode, extended modes of Tapping, phase, MFM, EFM.	Scan angle	Random
Sample size	Φ≤90mm,H≤20mm	Sample movement	0~20mm
Max. scan range	X/Y: 20 um, Z: 2 um	Pulse width of approaching  motor	10±2ms
Resolution	X/Y: 0.2 nm, Z: 0.05nm	Optical system	Magnification: 4X, resolution: 2.5 um
Scan rate	0.6Hz~4.34Hz	Data points	256×256,512×512
Scanning control	XY: 18-bit D/A, Z: 16-bit D/A	Feedback type	DSP digital feedback
Data sampling	One 14-bit A/D and double 16-bit A/D multiple-channel simultaneously
PC connection	USB2.0	Feedback sampling rate	64.0KHz
Windows	Compatible with Windows98/2000/XP/7/8

FSM built in 2013. In the past 9 years, we concentrate on making instruments for labs and factories.
We provide atomic force microscope for normal physical education and wifer inspection.
It is the best cost ratio AFM.
 

Detailed Photos

 

Why choose us?
1.Over many years' experience in production and service.
2.We are manufacturer who can give you Preferential price
3.ISO9001 certified.
4.lifetime after sales service warranty.
5.OEM service is available.
6. Strict quality inspection before shipment.