High-Resolution Teaching Student Microscope Instrument

• After-sales Service: 1 Year
• Warranty: 1 Year
• Magnification: >1000X
• Type: Video
• Number of Cylinder: Binoculars
• Mobility: Desktop
• Model NO.: FM-Nanoview TAPPING
• Stereoscopic Effect: Stereoscopic Effect
• Kind of Light Source: Ordinary Light
• Shape: Single-lens
• Usage: Teaching
• Principle: Optics
• Principle of Optics: Polarizing Microscope
• Sample Size: Φ≤90mm,H≤20mm
• Max. Scan Range: X/Y: 20 Um, Z: 2 Um
• Resolution: X/Y:160;0.2 Nm, Z: 0.05nm
• Scan Rate: 0.6Hz~4.34Hz
• Feedback Type: DSP Digital Feedback
• PC Connection: USB2.0
• Windows: Compatible with Windows98/2000/XP/7/8
• Scan Angle: Random
• Sample Movement: 0~20mm
• Data Points: 256×256,512×512
• Transport Package: Carton and Wooden
• Specification: 55 lbs
• Trademark: flyingman
• Origin: China
• HS Code: 9011800090
• Production Capacity: 100pieces/Month

Product Description

Introducing the FM-Nanoview TAPPING High Cost-efficiency Atomic Force Microscope by Suzhou FlyingMan Precision Instruments Co., Ltd. Ideal for high-resolution teaching and student use.

 

Product Description

Product Description

Welcome to Suzhou FlyingMan Precision Instruments Co., Ltd.

Features:

1. Scan head and sample stage designed together for strong anti-vibration performance.


2. Precision laser detection and probe alignment device for easy laser adjustment.


3. Servomotor-driven sample approaching tip for precision scanning area positioning.


4. High-accuracy and large range sample transfer device for scanning any area of interest.


5. Optical observation system for tip check and sample positioning.


6. Modular electronic system for easy maintenance and development.


7. Spring vibration isolation for simple and effective performance.

Software:

1. Two sampling pixel options: 256×256, 512×512.


2. Functionality for scan area move and cut to select any area of interest.


3. Random angle scanning at the beginning.


4. Real-time adjustment of laser spot detection system.


5. Palette options for different color scanning images.


6. Support for linear average and offset calibration in real-time.


7. Scanner sensitivity and electronic controller auto-calibration support.


8. Offline analysis and processing of sample images.

Explore our advanced product for precise scanning and analysis of samples with ease.

  

Product Parameters

Main Technical Parameters

Explore the technical specifications of the High-Resolution Teaching Student Microscope Instrument by Suzhou FlyingMan Precision Instruments Co., Ltd.

Item	Technical data	Item	Technical data
Operation modes	Contact mode, friction mode, extended modes of Tapping, phase, MFM, EFM.	Scan angle	Random
Sample size	Φ≤90mm,H≤20mm	Sample movement	0~20mm
Max. scan range	X/Y: 20 um, Z: 2 um	Pulse width of approaching  motor	10±2ms
Resolution	X/Y: 0.2 nm, Z: 0.05nm	Optical system	Magnification: 4X, resolution: 2.5 um
Scan rate	0.6Hz~4.34Hz	Data points	256×256,512×512
Scanning control	XY: 18-bit D/A, Z: 16-bit D/A	Feedback type	DSP digital feedback
Data sampling	One 14-bit A/D and double 16-bit A/D multiple-channel simultaneously
PC connection	USB2.0	Feedback sampling rate	64.0KHz
Windows	Compatible with Windows98/2000/XP/7/8

Welcome to Suzhou FlyingMan Precision Instruments Co., Ltd.

Established in 2013, we specialize in creating high-quality instruments for laboratories and factories. Our flagship product is the Atomic Force Microscope (AFM), designed for physical education and wafer inspection.

Key Features:

• Precision instrument for accurate measurements


• Cost-effective solution for AFM technology


• Enhances research and analysis in various industries

Experience the best cost ratio AFM with Suzhou FlyingMan Precision Instruments Co., Ltd. today!

 

Detailed Photos