FM-Nanoview 1000 Atomic Force Microscope
FM-Nanoview 1000 flyingman AFM Atomic Force Microscope
Product Description
I. Features
1. Scan head and sample stage are designed together, strong anti-vibration performance
2. Precision laser detection and probe alignment device make laser adjustment simple and easy;
3. Adapt servomotor to drive the sample approaching tip manually or automatically, to realize precision scanning area positioning.
4. High-accuracy and large range sample transfer device allow to scan any interesting area of sample ;
5. Optical observation system for tip check and sample positioning.
6. Electronic system is designed as modular and easy for maintenance and further development.
7. Adopt spring for vibration isolation, simple and good performance.
II. Software
1. Two kinds of sampling pixel for choose: 256×256, 512×512;
2. Execute scan area move and cut function, choose any interesting area of sample;
3. Scan sample in random angle at beginning;
4. Adjust the laser spot detection system in real time;
5. Choose and set different color of scanning image in palette.
6. Support linear average and offset calibration in real time for sample title;
7. Support scanner sensitivity calibration and electronic controller auto-calibration;
8. Support offline analysis and process of sample image.
Product Parameters
III. Main technical parameters
| Item |
Technical data |
Item |
Technical data |
| Operation modes |
Contact mode, friction mode, extended modes of Tapping, phase, MFM, EFM. |
Scan angle |
Random |
| Sample size |
Φ≤90mm,H≤20mm |
Sample movement |
0~20mm |
| Max. scan range |
X/Y: 20 um, Z: 2 um |
Pulse width of approaching motor |
10±2ms |
| Resolution |
X/Y: 0.2 nm, Z: 0.05nm |
Optical system |
Magnification: 4X, resolution: 2.5 um |
| Scan rate |
0.6Hz~4.34Hz |
Data points |
256×256,512×512 |
| Scanning control |
XY: 18-bit D/A, Z: 16-bit D/A |
Feedback type |
DSP digital feedback |
| Data sampling |
One 14-bit A/D and double 16-bit A/D multiple-channel simultaneously |
| PC connection |
USB2.0 |
Feedback sampling rate |
64.0KHz |
| Windows |
Compatible with Windows98/2000/XP/7/8 |
FSM built in 2013. In the past 9 years, we concentrate on making instruments for labs and factories.
We provide atomic force microscope for normal physical education and wifer inspection.
It is the best cost ratio AFM.
Detailed Photos
Why choose us?
1.Over many years' experience in production and service.
2.We are manufacturer who can give you Preferential price
3.ISO9001 certified.
4.lifetime after sales service warranty.
5.OEM service is available.
6. Strict quality inspection before shipment.
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