Ls-Afm Atomic Force Microscope System for Semiconductor Wafer Scanning

• After-sales Service: 1 Year
• Warranty: 1 Year
• Magnification: >1000X
• Shipping Cost: Estimated freight per unit.: about shipping cost and estimated delivery time.
• Currency: US$
• Return&refunds: You can apply for a refund up to 30 days after receipt of the products.
• Model NO.: LS AFM
• Type: Video
• Number of Cylinder: Binoculars
• Mobility: Desktop
• Stereoscopic Effect: Stereoscopic Effect
• Kind of Light Source: Ordinary Light
• Shape: Single-lens
• Usage: Teaching
• Principle: Optics
• Principle of Optics: Polarizing Microscope
• Sample Size: Φ≤90mm,H≤20mm
• Max. Scan Range: X/Y: 20 Um, Z: 2 Um
• Resolution: X/Y:160;0.2 Nm, Z: 0.05nm
• Scan Rate: 0.6Hz~4.34Hz
• Feedback Type: DSP Digital Feedback
• PC Connection: USB2.0
• Windows: Compatible with Windows98/2000/XP/7/8
• Scan Angle: Random
• Sample Movement: 0~20mm
• Data Points: 256×256,512×512
• Transport Package: Carton and Wooden
• Specification: 55 lbs
• Trademark: flyingman
• Origin: China
• HS Code: 9011800090
• Production Capacity: 100pieces/Month
• Package Size: 55.00cm * 55.00cm * 115.00cm
• Package Gross Weight: 65.000kg
• Lead Time: 90 days (1 - 1 Pieces) ; To be negotiated ( > 1 Pieces)

Product Description

 Atomic Force Microscope For Wafer Industry Type

Product Description

 

 

I. Features

The first large-scale industrial atomic force microscope in China to achieve commercial production
·The sample size and weight are almost unlimited, making it particularly suitable for testing large samples such as wafers, ultra large gratings, and optical glass
·The sample stage has strong expandability and is very convenient for multi instrument combination to achieve in-situ detection
·One click automatic scanning, capable of programming multiple test points for fast and automated detection
·Keep the sample stationary while scanning the image, and drive the probe to perform XYZ 3D motion measurement imaging
·Gantry scanning head design, marble base, vacuum adsorption stage
·Integrated mechanical vibration damping and environmental noise shielding solutions greatly reduce system noise levels
·Intelligent and fast needle insertion method for automatic detection of piezoelectric ceramics under motor control, protecting probes and samples
·Scanner nonlinear correction user editor, with nano characterization and measurement accuracy better than 98%




 
II. Software
1.  Two kinds of sampling pixel for choose: 256×256, 512×512;
2.  Execute scan area move and cut function, choose any interesting area of sample;
3.  Scan sample in random angle at beginning;
4.  Adjust the laser spot detection system in real time;
5.  Choose and set different color of scanning image in palette.
6.  Support linear average and offset calibration in real time for sample title;
7.  Support scanner sensitivity calibration and electronic controller auto-calibration;
8.  Support offline analysis and process of sample image.


 

Product Parameters

 

Working mode	Contact mode, Tapping mode	Z Lifting table	Stepper motor drive control with a minimum step size of 10nm
Optional mode	Friction force/lateral force, amplitude/phase,magnetic force/electrostatic force	Z Lifting stroke	20mm (optional 25mm)
Force spectrum curve	F-Z force curve, RMS-Z curve	Optical positioning	10X optical objective
XYZ Scanning method	Probe driven XYZ scanning	Camera	5 megapixel digital CMOS
XY Scanning Range	Greater than  100um×100um	Scan rate	0.6Hz~30Hz
Z Scan angle	Greater than 10um	Scan angle	0~360°
Scanning resolution	Horizontal 0.2nm, vertical 0.05nm	Operating environment	Windows 10 operating system
XY Sample Stage	Stepper motor drive control, with a movement accuracy of 1um	Communication interface	USB2.0/3.0
XY Shift motion	200×200mm(Optional 300×300mm)	Instrument structure	Gantry scanning head, marble base
Sample loading platform	Dia 200mm(Optional 300mm)	Damping method	Air floating shock absorption acoustic shielding cover (optional active shock absorption platform)
Sample Weight	≤20Kg

III. Main technical parameters

FSM built in 2013. In the past 9 years, we concentrate on making instruments for labs and factories.
We provide atomic force microscope for normal physical education and wifer inspection.
It is the best cost ratio AFM.
 

Detailed Photos

 

Why choose us?
1.Over many years' experience in production and service.
2.We are manufacturer who can give you Preferential price
3.ISO9001 certified.
4.lifetime after sales service warranty.
5.OEM service is available.
6. Strict quality inspection before shipment.