• Cost-Efficient Nanoview Atomic Force Microscope
  • Cost-Efficient Nanoview Atomic Force Microscope
  • Cost-Efficient Nanoview Atomic Force Microscope
  • Cost-Efficient Nanoview Atomic Force Microscope
  • Cost-Efficient Nanoview Atomic Force Microscope
  • Cost-Efficient Nanoview Atomic Force Microscope

Cost-Efficient Nanoview Atomic Force Microscope

After-sales Service: 1 Year
Warranty: 1 Year
Magnification: >1000X
Type: Video
Number of Cylinder: Binoculars
Mobility: Desktop
Customization:
Gold Member Since 2016

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  • Overview
  • Product Description
  • Product Parameters
  • Detailed Photos
Overview

Basic Info.

Model NO.
FM-Nanoview TAPPING
Stereoscopic Effect
Stereoscopic Effect
Kind of Light Source
Ordinary Light
Shape
Single-lens
Usage
Teaching
Principle
Optics
Principle of Optics
Polarizing Microscope
Sample Size
Φ≤90mm,H≤20mm
Max. Scan Range
X/Y: 20 Um, Z: 2 Um
Resolution
X/Y:160;0.2 Nm, Z: 0.05nm
Scan Rate
0.6Hz~4.34Hz
Feedback Type
DSP Digital Feedback
PC Connection
USB2.0
Windows
Compatible with Windows98/2000/XP/7/8
Scan Angle
Random
Sample Movement
0~20mm
Data Points
256×256,512×512
Transport Package
Carton and Wooden
Specification
55 lbs
Trademark
flyingman
Origin
China
HS Code
9011800090
Production Capacity
100pieces/Month

Product Description

Introducing the FM-NanoView TAPPING Atomic Force Microscope by Suzhou FlyingMan Precision Instruments Co., Ltd. A cost-efficient solution for high-quality imaging and analysis in research and educational settings.

 
Product Description






Product Description



Features



  1. Scan head and sample stage designed together for strong anti-vibration performance

  2. Precision laser detection and probe alignment device for easy laser adjustment

  3. Servomotor drive for precise scanning area positioning

  4. High-accuracy sample transfer device for scanning any area of interest

  5. Optical observation system for tip check and sample positioning

  6. Modular electronic system for easy maintenance and development

  7. Spring vibration isolation for simple and effective performance



Software



  1. Two sampling pixel options: 256×256, 512×512

  2. Functionality for moving and cutting scan areas

  3. Random angle scanning at the start

  4. Real-time adjustment of laser spot detection system

  5. Customizable scanning image colors in palette

  6. Support for linear average and offset calibration

  7. Scanner sensitivity and electronic controller auto-calibration

  8. Offline analysis and processing of sample images



Manufactured by Suzhou FlyingMan Precision Instruments Co., Ltd.




  
Product Parameters

Main Technical Parameters


Explore the key technical specifications of the Cost-Efficient NanoView Atomic Force Microscope by Suzhou FlyingMan Precision Instruments Co., Ltd.

Item Technical data Item Technical data
Operation modes Contact mode, friction mode, extended modes of Tapping, phase, MFM, EFM. Scan angle Random
Sample size Φ≤90mm,H≤20mm Sample movement 0~20mm
Max. scan range X/Y: 20 um, Z: 2 um Pulse width of approaching  motor 10±2ms
Resolution X/Y: 0.2 nm, Z: 0.05nm Optical system Magnification: 4X, resolution: 2.5 um
Scan rate 0.6Hz~4.34Hz Data points 256×256,512×512
Scanning control XY: 18-bit D/A, Z: 16-bit D/A Feedback type DSP digital feedback
Data sampling One 14-bit A/D and double 16-bit A/D multiple-channel simultaneously 
PC connection USB2.0 Feedback sampling rate 64.0KHz
Windows Compatible with Windows98/2000/XP/7/8





Atomic Force Microscope by Suzhou FlyingMan Precision Instruments Co., Ltd.



Atomic Force Microscope


Suzhou FlyingMan Precision Instruments Co., Ltd. has been specializing in building instruments for labs and factories since 2013. Our Atomic Force Microscope (AFM) is designed for physical education and wafer inspection, offering the best cost ratio in the market.



Features:



  • High precision imaging for accurate analysis

  • Easy to use interface for efficient operation

  • Versatile applications in various industries



Benefits:



  • Enhances research and development processes

  • Improves quality control in manufacturing

  • Cost-effective solution for advanced microscopy




 
Detailed Photos


Cost-Efficient Nanoview Atomic Force MicroscopeCost-Efficient Nanoview Atomic Force MicroscopeCost-Efficient Nanoview Atomic Force Microscope

 

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Gold Member Since 2016

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Export Year
2015-01-01
OEM/ODM Availability
Yes